Test Contactor System for Embedded Modules

Particularly suitable for Qseven or MXM

Stutensee (Germany) - The new test adapter, developed by Yamaichi for programming embedded modules is now available from MSC. It allows a particularly reliable and robust contacting the module with probe Pins, which can also be used for contacting in the semiconductor test. The adapter can be made according to customer specifications or in impendance-controlled Qseven standard. 

The unique test system is installed in the costumer´s application board. The interface between the test adapter and application board is build by the well-known Yamaichi BEC family, the compatibility with the MXM connector is included. The module (e.g. a Qseven or MXM module) is inserted into the test adapter and held during the testing or programming process. The use of high-performance probe-pins, which are also used for testing of semiconductor integrated circuits, ensures safe and reliable contacting. Here, the number of cycles of the test adapter exceeds many times that of the connector.The modules with the same sample, pin contacts on both sides with 230 pins and a pitch of 0.5 mm. However, other pin pitches and configurations are possible. 

The core of the test adapter is a multilayer flex/rigid PCB which ensures a high speed connection between module, probe pins and connector on the customer application test board. The impedance-controlled design of the flex/rigid PCB guarantees the high quality of time-critical signals.

The test adapter is typically used for qualification and evaluation purpose, in production for functional testing and module programming. Additionally for laboratory investigation and quality assurance with temperature cycles up to +85°C pemco@msc-ge.com.